Critical resolved shear stress measurements for silicon‐doped GaAs single crystals
نویسندگان
چکیده
منابع مشابه
Making angle-resolved photoemission measurements on corrugated monolayer crystals: Suspended exfoliated single-crystal graphene
Kevin R. Knox,1,2 Andrea Locatelli,3 Mehmet B. Yilmaz,4 Dean Cvetko,5,6 Tevfik Onur Menteş,3 Miguel Ángel Niño,3,7 Philip Kim,1 Alberto Morgante,5,8 and Richard M. Osgood Jr.2 1Department of Physics, Columbia University, New York, New York, USA 2Department of Applied Physics, Columbia University, New York, New York, USA 3Elettra–Sincrotrone Trieste S.C.p.A., Basovizza, Trieste, Italy 4Departmen...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1987
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.97860